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Early detection of Zymoseptoria tritici infection on wheat leaves using hyperspectral imaging data
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Data collection: The experiment was conducted on two genotypes of durum wheat (Triticum turgidum durum) cultivated under controlled conditions in a growth chamber. Hyperspectral images were collected in planta for twenty-two days to monitor leaf blotch disease caused by the fungal pathogen Zymoseptoria tritici. Images were acquired on the first ligulated leaf in a non-destructive way using two devices: HySpex VNIR-1800 and HySpex SWIR-384 (Norsk Elektro Optikk, Norway).. International audience. This article presents a hyperspectral imaging (HSI) database of healthy leaves and leaves infected with Zymoseptoria tritici fungal pathogen responsible for leaf blotch (Lb) disease. Leaves of two durum wheat genotypes were studied under controlled conditions to track the evolution of Lb disease and capture significant spectral and spatial differences until the onset of symptoms. Hyperspectral image acquisitions were purchased with two cameras in visible-near infrared (VNIR) and short-wave infrared (SWIR) spectral ranges on eighteen dates between one day before inoculation and twenty days after inoculation. For each wavelength range studied, a total of 1175 images provided information on 3326 leaves measured throughout the experiment. These data are valuable since they can be used as a basis to monitor disease's development over time, to build leaf classification models according to their infection status per genotype per day, to develop prediction models related to symptoms' appearance, or to test imaging and spectral analysis methods.