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Automated rejection and repair of bad trials in MEG/EEG

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Jas, Mainak | Engemann, Denis | Raimondo, Federico | Bekhti, Yousra | Gramfort, Alexandre

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International audience. We present an automated solution for detecting bad trials in magneto-/electroencephalography (M/EEG). Bad trials are commonly identified using peak-to-peak rejection thresholds that are set manually. This work proposes a solution to determine them automatically using cross-validation. We show that automatically selected rejection thresholds perform at par with manual thresholds, which can save hours of visual data inspection. We then use this automated approach to learn a sensor-specific rejection threshold. Finally, we use this approach to remove trials with finer precision and/or partially repair them using interpolation. We illustrate the performance on three public datasets. The method clearly performs better than a competitive benchmark on a 19-subject Faces dataset.

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