Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging reveals cholesterol overload in the cerebral cortex of Alzheimer disease patients - Vigipallia

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging reveals cholesterol overload in the cerebral cortex of Alzheimer disease patients

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Lazar, Adina | Bich, Claudia | Panchal, Maï | Desbenoit, Nicolas | Petit, Vanessa | Touboul, David | Dauphinot, Luce | Marquer, Catherine | Laprévote, Olivier | Brunelle, Alain | Duyckaerts, Charles

Edité par CCSD ; Springer Verlag -

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Langue: en

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