Syracuse

Multiple labels point-set registration

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van Reeth, E., van Reeth | Sdika, M | Luppi, P.-H. | Libourel, P.-A. | Beuf, O.

Edité par CCSD -

International audience. A multi-label point-set registration method is presented in this paper. It focuses on carefully computing an initial transform to help the registration process converge towards the optimal deformation. The proposed method is particularly efficient in cases where the deformation is discontinuous or nearly discontinuous. A simple synthetic example is presented to illustrate the advantage of the method. A real-data example is also presented in the context of multi-modality registration (block-face to Magnetic Resonance Imaging, MRI) for brain atlas construction. In both examples, visual and numeric results illustrate the superiority of the presented method compared to two recent multi-label registration contributions.

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